EFDA-JET-CP(03)01/72

2003 30th EPS Conference on Controlled Fusion and Plasma Physics, St. Petersburg, Russia, (7th–11th July)

XUV Spectral Line Intensity Ratio Measurements for the Development of an Alpha-Particle Diagnostic


EFDA-JET-PR(12)20

The Effect of Ionization on the Populations of Excited Levels of C IV and C V in Low Density Plasmas


EFDA-JET-PR(10)07

An Analysis of VUV C IV Emission from the JET Divertor Giving Measurements of Electron Temperatures


EFDA-JET-PR(09)22

Electron Impact Excitation of Kr XXVIII


EFDA-JET-PR(08)19

Energy Levels and Radiative Rates for Transitions in B-like to F-like Xe ions (Xe L – XLVI)


EFDA-JET-PR(08)11

Electron Impact Excitation of Boron-Like Kr XXXII


JET-P(93)78

Ne IX and Ne X Spectra on the JET Tokamak


JET-P(91)49

Electron Temperature and Density Sensitive X-Ray Enission Line Ratios for CI XVI


EFDA-JET-R(10)02

Comparison of Modelled C VUV Line Intensity Ratios with Observations of the Emission from the JET Plasma SOL-II


EFDA-JET-R(08)04

Comparison of Modelled C VUV Line Intensity Ratios with Observations of the Emission from the JET Plasma SOL-I