JET-P(92)36

Measurements of ELMs and Associated Fluctuations with the Multichannel Reflectometer System

The potential and limitations of JETs Multichannel Reflectometer System for studying ELMs have been evaluated. Two new methods for calibrating fixed frequency data have been developed to cope with the problems caused by ELMs. Results on both the temporal and radial evolution of the ELMs and associated fluctuations are presented, and the significance of the relative proportion of phase and amplitude fluctuations is discussed.
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JETP92036 976.90 Kb