EFDA-JET-PR(08)34

An Absolute Sensitivity Calibration of the JET VUV SPRED Spectrometer

The determination of a good relative and absolute sensitivity calibration for wideband VUV spectrometers is challenging. On JET, the possible T and Be contamination of the VUV spectrometer precludes its removal to a synchrotron source and, consequently, a range of alternative in-situ techniques have been investigated in depth. This has resulted in a reliable calibration for the complete spectral range, the relative calibration at short wavelengths being particularly accurate. At these wavelengths, a novel approach is used, in which the calibration is extended using a number of Na- and Li-like metal doublets. At longer wavelengths, the Li-like doublets of Ar and Ne have been used in conjunction with CII, CIII and CIV line intensity ratios. Unexplained discrepancies between the measured and modelled C results has meant that the exceptional short wavelength accuracy has not be repeated at these longer wavelengths. The absolute sensitivity has been determined from branching ratios to an absolutely calibrated visible spectrometer. The long term stability of the calibration is discussed.
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EFDP08034 1.12 Mb